electron energy loss spectroscopy eels data (Gatan Inc)
98
Structured Review
Gatan Inc
electron energy loss spectroscopy eels data
Electron Energy Loss Spectroscopy Eels Data, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 98/100, based on 7149 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+energy+loss+spectroscopy+eels+data/GIF+Continuum+and+Continuum+S/arxiv__2602__21364-298-0-10
Average 98 stars, based on 7149 article reviews
Electron Energy Loss Spectroscopy Eels Data, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 98/100, based on 7149 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+energy+loss+spectroscopy+eels+data/GIF+Continuum+and+Continuum+S/arxiv__2602__21364-298-0-10
Average 98 stars, based on 7149 article reviews
electron energy loss spectroscopy eels data - by Bioz Stars,
2026-10
98/100 stars
Images
Related Articles
Spectroscopy:Article Title: Kinetically controlled hetero-fusion is a systems-level behaviour of polymer nanoparticle populations Article Snippet: .. Article Title: Granular aluminum induced superconductivity in germanium for hole spin-based hybrid devices Article Snippet: STEM analysis Xenon base Plasma focused ion beam (PFIB) is used to fabricate electron transparent lamella for the scanning transmission electron microscopy (STEM) analyses, which were conducted using a double-aberration correction Thermo Fisher Scientific (TFS) Spectra 300 microscope operated at 300 keV. .. Article Title: Kinetically controlled hetero-fusion is a systems-level behaviour of polymer nanoparticle populations. Article Snippet: .. Article Title: Multiple phases carbon-based coatings prepared by multi-arc ion plating: structural modulation and tribo-adaptability Article Snippet: Friction protection is a critical aspect in engineering applications, where carbon films have been extensively studied due to their exceptional low-friction properties.. In this work, multiple phases carbon-based coatings were deposited using multi-arc ion plating (MAIP), and the effects of four process parameters—bias voltage, arc current, Ar flow rate, and deposition temperature—on film growth and performance were systematically investigated.. The morphology and microstructure of the films were characterized via scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and transmission electron microscopy (TEM). Article Title: In situ TEM study of radiation tolerance of Fe-substituted hollandite Article Snippet: Nuclear waste forms are materials designed to encase and isolate radioactive isotopes.. This material form ensures safe containment and minimizes the release of harmful radiation into the environment.. The radiation stability of the material during radioactive decay of the encapsulated isotopes is an important property to evaluate for waste forms as a long-term storage solution for nuclear waste. Article Title: Electron microscopy data on irradiation effects in glassy carbon, nuclear graphite, pyrolytic carbon, and carbon fibers Article Snippet: Type of data , Raw images are provided in .tif format and consist of transmission electron microscopy micrographs. The image folders are labeled according to their corresponding figure in this article and irradiation conditions.. .. Data collection , The TEM bright-field data was collected using a JEOL 2100F transmission electron microscope operated at 80 kV in bright-field mode. Bright-field TEM images and Dispersion:Article Title: Kinetically controlled hetero-fusion is a systems-level behaviour of polymer nanoparticle populations Article Snippet: .. Article Title: Granular aluminum induced superconductivity in germanium for hole spin-based hybrid devices Article Snippet: STEM analysis Xenon base Plasma focused ion beam (PFIB) is used to fabricate electron transparent lamella for the scanning transmission electron microscopy (STEM) analyses, which were conducted using a double-aberration correction Thermo Fisher Scientific (TFS) Spectra 300 microscope operated at 300 keV. .. Article Title: Kinetically controlled hetero-fusion is a systems-level behaviour of polymer nanoparticle populations. Article Snippet: .. Software:Article Title: Granular aluminum induced superconductivity in germanium for hole spin-based hybrid devices Article Snippet: STEM analysis Xenon base Plasma focused ion beam (PFIB) is used to fabricate electron transparent lamella for the scanning transmission electron microscopy (STEM) analyses, which were conducted using a double-aberration correction Thermo Fisher Scientific (TFS) Spectra 300 microscope operated at 300 keV. .. other:Article Title: Boosting methanol steam reforming performance via crystal-phase-driven strong metal-support interactions: From encapsulated Pt nanoparticles to deeply embedded PtO -induced Pt single atoms Article Snippet: Traditional strong metal-support interactions (SMSIs) induced by encapsulated reducible oxide overlayers on metal nanoparticles can suppress sintering but has a strong negative impact on the catalytic activity because of decreased availability of active sites.. Herein, we design three SMSIs configurations on Pt-TiO2 via crystal-phase engineering.. These configurations comprised encapsulated Pt nanoparticle (NPs) with TiO2−x overlayer on anatase, weakly embedded Pt clusters on P25, and deeply embedded PtOx-induced Pt single-atom (SA) structure on rutile. Article Title: Metastable dual-defect states drive deep protonation for selective CO 2 photomethanation Article Snippet: The chemical states and surface composition were analyzed by X-ray photoelectron spectroscopy (XPS) on a Thermo Scientific ESCALAB Xi+ system with Al Kα radiation (1486.6 eV), applying C 1 s at 284.8 eV for charge correction. Transmission Assay:Article Title: Multiple phases carbon-based coatings prepared by multi-arc ion plating: structural modulation and tribo-adaptability Article Snippet: Friction protection is a critical aspect in engineering applications, where carbon films have been extensively studied due to their exceptional low-friction properties.. In this work, multiple phases carbon-based coatings were deposited using multi-arc ion plating (MAIP), and the effects of four process parameters—bias voltage, arc current, Ar flow rate, and deposition temperature—on film growth and performance were systematically investigated.. The morphology and microstructure of the films were characterized via scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and transmission electron microscopy (TEM). Article Title: Electron microscopy data on irradiation effects in glassy carbon, nuclear graphite, pyrolytic carbon, and carbon fibers Article Snippet: Type of data , Raw images are provided in .tif format and consist of transmission electron microscopy micrographs. The image folders are labeled according to their corresponding figure in this article and irradiation conditions.. .. Data collection , The TEM bright-field data was collected using a JEOL 2100F transmission electron microscope operated at 80 kV in bright-field mode. Bright-field TEM images and Microscopy:Article Title: Multiple phases carbon-based coatings prepared by multi-arc ion plating: structural modulation and tribo-adaptability Article Snippet: Friction protection is a critical aspect in engineering applications, where carbon films have been extensively studied due to their exceptional low-friction properties.. In this work, multiple phases carbon-based coatings were deposited using multi-arc ion plating (MAIP), and the effects of four process parameters—bias voltage, arc current, Ar flow rate, and deposition temperature—on film growth and performance were systematically investigated.. The morphology and microstructure of the films were characterized via scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and transmission electron microscopy (TEM). Article Title: Electron microscopy data on irradiation effects in glassy carbon, nuclear graphite, pyrolytic carbon, and carbon fibers Article Snippet: Type of data , Raw images are provided in .tif format and consist of transmission electron microscopy micrographs. The image folders are labeled according to their corresponding figure in this article and irradiation conditions.. .. Data collection , The TEM bright-field data was collected using a JEOL 2100F transmission electron microscope operated at 80 kV in bright-field mode. Bright-field TEM images and Electron Microscopy:Article Title: Multiple phases carbon-based coatings prepared by multi-arc ion plating: structural modulation and tribo-adaptability Article Snippet: Friction protection is a critical aspect in engineering applications, where carbon films have been extensively studied due to their exceptional low-friction properties.. In this work, multiple phases carbon-based coatings were deposited using multi-arc ion plating (MAIP), and the effects of four process parameters—bias voltage, arc current, Ar flow rate, and deposition temperature—on film growth and performance were systematically investigated.. The morphology and microstructure of the films were characterized via scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and transmission electron microscopy (TEM). Transmission Electron Microscopy:Article Title: Multiple phases carbon-based coatings prepared by multi-arc ion plating: structural modulation and tribo-adaptability Article Snippet: Friction protection is a critical aspect in engineering applications, where carbon films have been extensively studied due to their exceptional low-friction properties.. In this work, multiple phases carbon-based coatings were deposited using multi-arc ion plating (MAIP), and the effects of four process parameters—bias voltage, arc current, Ar flow rate, and deposition temperature—on film growth and performance were systematically investigated.. The morphology and microstructure of the films were characterized via scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and transmission electron microscopy (TEM). Article Title: Electron microscopy data on irradiation effects in glassy carbon, nuclear graphite, pyrolytic carbon, and carbon fibers Article Snippet: Type of data , Raw images are provided in .tif format and consist of transmission electron microscopy micrographs. The image folders are labeled according to their corresponding figure in this article and irradiation conditions.. .. Data collection , The TEM bright-field data was collected using a JEOL 2100F transmission electron microscope operated at 80 kV in bright-field mode. Bright-field TEM images and Imaging:Article Title: Multiple phases carbon-based coatings prepared by multi-arc ion plating: structural modulation and tribo-adaptability Article Snippet: Friction protection is a critical aspect in engineering applications, where carbon films have been extensively studied due to their exceptional low-friction properties.. In this work, multiple phases carbon-based coatings were deposited using multi-arc ion plating (MAIP), and the effects of four process parameters—bias voltage, arc current, Ar flow rate, and deposition temperature—on film growth and performance were systematically investigated.. The morphology and microstructure of the films were characterized via scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and transmission electron microscopy (TEM). In Situ:Article Title: Electron microscopy data on irradiation effects in glassy carbon, nuclear graphite, pyrolytic carbon, and carbon fibers Article Snippet: Type of data , Raw images are provided in .tif format and consist of transmission electron microscopy micrographs. The image folders are labeled according to their corresponding figure in this article and irradiation conditions.. .. Data collection , The TEM bright-field data was collected using a JEOL 2100F transmission electron microscope operated at 80 kV in bright-field mode. Bright-field TEM images and |